Topic: Characterisation of the temperature decay of electronic components following high and low temperature storage
Background and Method
- Certain product parameters are to be determined at high and low temperatures while their measurement directly in the climate chamber is not possible
- In practice, the parameters are measured directly following the temperature storage - at unknown component temperature
- By knowledge of the temperature decay curve of the components the temperature in the instant of parameter measurement can be deduced
- Temperature decay curves have been measured by a thermographic camera
Results
- The components' temperature decay is a rapid process and follows an exponential model
- For example, 15 seconds after removal from the climate chamber, the component temperature differs by 30°C from the storage temperature